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Search for "quantitative force measurement" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.
Quantitative dynamic force microscopy with inclined tip oscillation
Beilstein J. Nanotechnol. 2022, 13, 610–619, doi:10.3762/bjnano.13.53
- measuring a heterogeneous atomic surface. We propose to measure the AFM observables along a path parallel to the oscillation direction in order to reliably recover the force along this direction. Keywords: atomic force microscopy; cantilever; quantitative force measurement; sampling path; Introduction
![[Graphic 38]](/bjnano/content/inline/2190-4286-13-53-i79.svg?max-width=637&scale=1.18182)
and the axis w....
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